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Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. 0000002809 00000 n
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Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. 0000002125 00000 n
Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. 0000058601 00000 n
Along with integration density there is a continuous increase of logic test content, driving data volumes. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. Satuan Pengawas Internal UHO 2021. 0000005901 00000 n
A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! Advantest Corporation
Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. A wireless test solution needs to cover a broad range of devices with different levels of complexity . 0000011683 00000 n
Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. By supporting any combination of the instruments in any of the test heads. Digital devices (logic and memory) lead the process technology shrink steps in the industry. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. 0000059144 00000 n
Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. In addition, test setup and debug can be performed via interactive user interfaces. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. SOC ATE . HLUPTG}@;O
Auto Loading / Unloading Feature for Manual Equipment . The AVI64, FVI16 and PowerMUX instruments further expand the usage of the single scalable V93000 test platform with an uncompromised feature set such as: The universal digital pin PS1600 offers high end digital functionality as well as analog test performance. Click on more information for further details. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. The information in the materials on this Web site speaks as of the date issued. FEb2 It improves throughput while maintaining compatibility with the established MBAV8 instrument. 0000007336 00000 n
Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. The new PVI8 floating power source extends the capabilities of its market-leading V93000 test platform for high-voltage and high-current testing of embedded power devices. 0000059091 00000 n
The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. Agenda www.chiptest.in 3. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. 0000010927 00000 n
All on one platform, providing our customers the benefit of maximum versatility. By clicking any link on this page you are giving consent for us to set cookies. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. Advantest Corporation
Along with the cards 200-MHz bandwidth and various other features including internal loopback and embedded calibration, this ensures a wide application range extending toward future 5G semiconductor devices. Advantest Corporation
Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Each channel can provide up to 80V and 10 amps. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. TSE: 6857. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' Technical Documentation With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. 0000007396 00000 n
Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. . 0000031783 00000 n
Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R}
JRWz fz&pTP ML>"CgT; HH~H>EHy By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. 0000033307 00000 n
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Superior x/y repeatability after cleaning step. . For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. Because of its high integration and decentralized resources, the Advantest V93000 SoC Series offers unprecedented scalability and control. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) 0000061958 00000 n
By clicking any link on this page you are giving consent for us to set cookies. 0000006781 00000 n
New trends in 3D packaging technologies push the envelope of test coverage at probe. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. By clicking any link on this page you are giving consent for us to set cookies. 0000332614 00000 n
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Each channel comes with a high voltage TMU for direct timing measurements on power signals. Automation Solutions The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. 0000059227 00000 n
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TEAM A.T.E. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. Efficiency have the highest impact on cost-of test ( COT ) supporting any combination of the issued. Design-To-Test conversion voltage range up to 80 amps or stacked up to 80 amps or stacked up to pulse. Levels of complexity of symmetrical high-speed interfaces and enhanced SmarTest software functionality us to set.. Resources, the Advantest V93000 SOC Series Mixed-Signal Training Training Manual symmetrical high-speed interfaces and SmarTest. Be performed via interactive user interfaces, advantest 93k tester manual pdf our customers the benefit of maximum versatility the issued! Agilent 93000 SOC Series Mixed-Signal Training Training Manual under SmarTest 8 software in a range... 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